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Atomic Force Microscopy Wiley Online Books ~ This book enlightens readers on the basic surface properties and distancedependent intersurface forces one must understand to obtain even simple data from an atomic force microscope AFM The material becomes progressively more complex throughout the book explaining details of calibration physical origin of artifacts and signalnoise limitations
Atomic Force Microscopy Understanding Basic Modes and ~ 9 Advanced Dynamic Force Methods 400 91 Principles of Electronic Methods Utilizing Dynamic AFM 401 911 Shifted Dynamic Response due to Force Gradient 402 912 Interleave Methods for LongRange Force Probing 405 913 InterleaveBased EFMKFM on Different Metals and Silicon 408 914
Atomic Force Microscopy Understanding Basic Modes and ~ Addressing the gap in the field Atomic Force Microscopy is a comprehensive primer covering knowledge readers need in order to become astute operators of AFM including basic principles data analysis and such applications as imaging materials property characterization inliquid interfacial analysis tribology frictionwear electrostatics and more
Atomic Force Microscopy Understanding Basic Modes and ~ Atomic Force Microscopy Understanding Basic Modes and Advanced Applications This book enlightens readers on the basic surface properties and distancedependent intersurface forces one must understand to obtain even simple data from an atomic force microscope AFM
Understanding Basic Modes and Advanced Applications ~ Atomic Force Microscopy Understanding Basic Modes and Advanced Applications Greg Haugstad To be published Wiley 2012 Table of Contents Preface Acknowledgements 1 Overview of AFM 11 The essence of the technique 12 Property sensitive imaging vertical touching and sliding friction 13 Modifying a surface with a tip 14
Atomic Force Microscopy Understanding Basic Modes and ~ Atomic Force Microscopy Understanding Basic Modes and Advanced Applications Description This book enlightens readers on the basic surface properties and distancedependent intersurface forces one must understand to obtain even simple data from an atomic force microscope AFM
Atomic Force Microscopy Understanding Basic Modes and ~ Atomic Force Microscopy Understanding Basic Modes and Advanced Applications First Edition Greg Haugstad John Wiley Sons Hoboken NJ USA 2012 464 pp hardcover ISBN 9780470638828
Atomic Force Microscopy Understanding Basic Modes and ~ title Atomic Force Microscopy Understanding Basic Modes and Advanced Applications abstract This book enlightens readers on the basic surface properties and distancedependent intersurface forces one must understand to obtain even simple data from an atomic force microscope AFM
ATOMIC FORCE MICROSCOPY Wiley Online Library ~ 9 Advanced Dynamic Force Methods 400 91 Principles of Electronic Methods Utilizing Dynamic AFM 401 911 Shifted Dynamic Response due to Force Gradient 402 912 Interleave Methods for LongRange Force Probing 405 913 InterleaveBased EFMKFM on Different Metals and Silicon 408 914 KFM of Organic Semiconductor Including CrossTechnique
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